Mask defect repair method

ABSTRACT

First, a region including the defect is observed with the atomic force microscope (AFM) and a pattern putting together the shape and position of the defect is extracted from and AFM image. The extracted pattern is then converted to a shape format for a for an ion beam defect repairing apparatus and transferred. At this time, a pattern that is observable with the ion beam defect repairing apparatus is selected as a position alignment pattern. The extracted/converted position alignment pattern is combined with a pattern corresponding to a secondary electron image or a secondary ion image. Repairing of the irradiation region and similar repairing is then performed with respect to matching processing for a pattern for a normal secondary ion image or secondary electron image for the ion beam defect repairing apparatus and extraction is performed by the AFM. A defect region finely adjusted using alignment of the position alignment pattern is then corrected using an ion beam.

BACKGROUND OF THE INVENTION

[0001] The present invention relates to a method for correcting defects in a photomask or reticule.

[0002] Photomasks of the related art are opaque films where a metal film such as Cr or an attenuated phase shifting mask material such as MoSiON is deposited by sputtering onto a glass substrate such as silicon glass so that the mask pattern brings about a transformation due to differences in the transmittance of light. Therefore, when performing monitoring/repair using a defect repairing apparatus employing an ion beam as a charged particle beam, electrons are irradiated and charge neutralization takes place in order to prevent primary ions from being curved due to charging up and in order to prevent it from becoming possible to no longer observe secondary ion images or secondary electron images. When design rules are not severe, images to confirm defective regions that are sufficient for practical purposes can be obtained by optimizing the charge neutralization conditions. However, as a result of recent severity of design rules, with isolation patterns or patterns (OPC patterns) introduced to correct optical proximity effects of exposure apparatus, it has become difficult to observe shapes correctly at the ends of patterns, charge neutralization conditions have become different for every pattern, and small features has meant that viewing has become impossible, even if charge neutralization is performed using electrons. An extent of repair that satisfies the specifications sought in defect repair therefore cannot be achieved because correct confirmation of defects cannot be achieved for these kind of detailed isolation patterns or OPC patterns.

[0003] Further, in recent years, Atomic Force Microscopes (AFM) with a high spatial resolution have been used in place of optical microscopes or probe method thickness measurers as the size of defects to be repaired has become smaller. The processing quality of locations repaired for clear defects and opaque defects is then evaluated using a defect repairing apparatus using an ion beam. AFM's have a structure which is easily charged up and are capable of monitoring with a high spatial resolution with respect to photomasks and reticules. Further, with regards to secondary charged particle images like secondary electron images or secondary ion images of defect repairing apparatus employing ion beams or secondary electron images of scanning electron microscope, AFM's are also capable of monitoring detailed isolation patterns and fine shapes of OPC patterns that could not formerly be viewed due to charging up.

[0004] In recent years the demands made of system LSI's have increased and a variety of uses have been advanced for fine-detail isolation patterns and OPC patterns. High accuracy, high quality repairing of these defects has also been sought for defect repairing apparatus. Accurate recognition of defect shape and position has therefore been demanded.

[0005] The present invention therefore sets out to enable high accuracy and high quality defect repair for finely detailed isolation patterns and OPC patterns that were formerly difficult to observe with ion beam defect repairing apparatus due to charging up.

SUMMARY OF THE INVENTION

[0006] In addition to having a high spatial resolution, an atomic force microscope is also capable of observing insulators with a high resolution. First, a region including the defect is observed with the atomic force microscope (AFM) and a pattern putting together the shape and position of the defect is extracted from an AFM image. The extracted pattern is then converted to a shape format for a repairing apparatus using an ion beam and saved. At this time, a pattern that is observable with a repairing apparatus employing an ion beam is selected as a position alignment pattern. A mask for which a defect is recognized using an AFM is then moved to the apparatus employing an ion beam. A pattern including the defect extracted and converted from an AFM image is then read in. A position alignment pattern for an extracted pattern is then combined with a pattern corresponding to a secondary electron image or secondary ion image for a region including the defect. Adjustment of the irradiation region and similar adjustment is then performed with respect to matching processing for a pattern for a normal secondary ion image or secondary electron image for the repairing apparatus employing an ion beam and extraction is performed by the AFM. A defect region finely adjusted using alignment of the position alignment pattern is then corrected using an ion beam.

[0007] [Operation]

[0008] An AFM capable of high resolution observation even for insulating materials is used to recognize defects and a pattern that is not subject to the influence of charging up is lined up for position alignment. High precision repairing of defects which it was, up until now, difficult to correct using defect repairing apparatus employing ion beams is now possible. Further, if the extent of irradiation with an ion beam is controlled by actively utilizing height information obtained during AFM observation, a problem of detecting end points using ion signals for which images could not be seen due to charging up is resolved, and high quality repairing of defects is possible even for black defects.

BRIEF DESCRIPTION OF THE DRAWINGS

[0009]FIG. 1 is a view showing a pattern for providing position alignment with a defect region when observing with an AFM.

[0010]FIG. 2 is a view showing a pattern for providing position alignment with a defect region extracted using an AFM converted to a shape format for use with an ion beam defect repairing apparatus.

[0011]FIG. 3 is a view showing a pattern for providing position alignment with a defect region when observing with an ion beam defect repairing apparatus.

[0012]FIG. 4 is a view illustrating combination with a pattern for position alignment observed by an ion beam defect repairing apparatus for a pattern for position alignment extracted by an AFM.

[0013]FIG. 5 is a view showing a region actually processed by an ion beam after combining the patterns.

[0014]FIG. 6 is an outline cross-sectional view showing processing using an ion beam in combination for a defect region recognized using an AFM that effectively exhibits the feature of the present invention.

[0015]FIG. 7 is a view showing a region actually processed with an ion beam after combining patterns for the case where defects cannot be seen using an ion beam defect repairing apparatus.

[0016]FIG. 8 is an outline cross-sectional view showing a region processed with an ion beam when opaque defects cannot be seen using an ion beam defect repairing apparatus.

[0017]FIG. 9 is an outline cross-sectional view illustrating the case where clear defects are repaired using the sent invention.

[0018]FIG. 10 is a flowchart showing a defect repairing procedure of the present invention.

[0019] [Description of the Numerals]

[0020]1 defect region recognized by AFM observation

[0021]2 pattern for position alignment observed by AFM

[0022]3 a defect region converted to shape format for ion beam defect repairing apparatus

[0023]3 b defect region subjected to pattern superimposition and irradiation region correction

[0024]4 position alignment pattern converted to shape format for ion beam defect repairing apparatus

[0025]5 defect region observed by ion beam defect repairing apparatus

[0026]6 position alignment pattern observed by an ion beam defect repairing apparatus

[0027]7 glass substrate

[0028]8 ion beam

[0029]9 gas injector

[0030]10 source gas for clear defect repairing film

[0031]11 clear defect repairing film

DETAILED DESCRIPTION OF THE INVENTION

[0032] The following is a description of the present invention applied to the case where shapes of opaque defects cannot be correctly recognized due to charging up.

[0033] A stage is moved to a location where a defect is found using the defect inspection tool and a region including the defect is observed using an atomic force microscope (AFM). A pattern 2 for performing position alignment for a region 1 for a defect from an AFM image shown in FIG. 1 is extracted as shown in FIG. 2. The extracted pattern is then converted to a repairing apparatus-specific shape format using an ion beam and this is saved. At this time, a pattern that is not influenced by charge-up even with a repairing apparatus employing an ion beam is selected as a position alignment pattern 2. Data for a defect region 3 a extracted/converted from the AFM image and a position alignment pattern 4 is transferred to the repairing apparatus employing an ion beam.

[0034] A mask for which a defect region has been recognized using an AFM is then moved to the apparatus employing the ion beam and the stage is moved to the location where the defect was found using the defect scanning apparatus. A secondary electron image or secondary ion image for the region including the defect is then observed using the repairing apparatus employing the ion beam. A position alignment pattern 4 extracted from the AFM image is then lined up with a pattern corresponding to a secondary electron image or secondary ion image 6 for a region including the defect shown in FIG. 3 as shown in FIG. 4. After the kind of pattern adjustment shown in FIG. 5 is complete, irradiation region repairing and similar repairing is performed taking into consideration the shape of an ion beam with respect to mapping processing for patterns from normal secondary ion images or secondary electron images for the repairing apparatus employing an ion beam. Rather than the defect region 5 that can be seen in a secondary ion image or secondary electron image, the defect region 3 a extracted by the AFM and the defect region 3 b subjected to the aforementioned lining up and correction are used in removal/repair using the ion beam as shown in FIG. 6.

[0035] End point detection utilizing ion signals and a contrast disparities due to materials for secondary electrons is not successful because an image cannot be seen because of charging up. Height information for the defect region at the time of defect recognition by the AFM as shown in FIG. 6 is also collected. The extent of irradiation with an ion beam during opaque defect repairing by the defect repairing apparatus using an ion beam based on this information is then decided upon, and it is ensured that there is little material left after removal and little damage to a glass substrate 7.

[0036] Next, a description is given of an example of the present invention applied to the case where a opaque defect cannot be seen with an ion beam defect repairing apparatus because of charging up.

[0037] A pattern for position alignment with the defect region is extracted from an AFM image using the same method as for the case for where defect shape could not be correctly recognized because of charge up and converted data is then transferred to repairing apparatus employing an ion beam. Secondary electron image or secondary ion image observation of a region including the defect is then carried out by the repairing apparatus employing the ion beam. The position alignment pattern 4 extracted by the AFM as shown in FIG. 7 is then lined up with the position alignment pattern 6 obtained for the secondary ion image or secondary electron image. The defect cannot be seen for the secondary ion image or the secondary electron image but the ion beam is irradiated as shown in FIG. 8 onto the region 3 b extracted by the AFM and subjected to positional alignment and irradiation position repairing, and the opaque defect is repaired.

[0038] The above description is given for opaque defects. However, if a region 3 a extracted by an AFM and subjected to position alignment and irradiation position correction is irradiated with an ion beam while supplying a clear defect repairing film source gas 10 from a gas injector 9 located in the vicinity of a mask as shown in FIG. 9, a clear defect repairing film 11 is deposited and the clear defect can be repaired using the same procedure as for the black defect.

[0039] The flow for the defect repairing of the present invention is shown in FIG. 10.

[0040] As described above, according to this invention, an AFM that is capable of recognizing defects that easily become charged up and is capable of high resolution observation for defect recognition even with insulating materials such as masks is used. The precise shape and position of defects can therefore be understood, and processing is performed in combination with a pattern used for position alignment during defect repairing using an ion beam that is not influenced by charging up. Defects that up to now were subject to the influence of charging up which made the use of defect repairing apparatus employing ion beams difficult can therefore now be repaired in a highly accuracy manner and with a high degree of quality. 

1. A method for correcting a mask, wherein a pattern for position alignment with a defect region is extracted from a high-resolution image for a region including the defect taken with an atomic force microscope for a region where the shape could not accurately be understood by a mask defect repairing apparatus employing an ion beam because of charging up, a pattern for position alignment with the shape of the extracted defect region is converted to a shape format for a mask defect repairing apparatus employing an ion beam and taken in, the extracted position alignment pattern is combined with a position alignment pattern for a secondary charged particle image for a region including the defect, and the extracted defect region is repaired using an ion beam.
 2. The method of correcting a mask of claim 1, wherein ion beam repair is performed in combination with a defect image for a secondary ion image.
 3. The method of correcting a mask of claim 1, wherein ion beam repair is performed in combination with a defect image for a secondary electron image.
 4. The method of correcting a mask of claim 1, wherein the defect is a black defect.
 5. The method of correcting a mask of claim 1, wherein the defect is a white defect.
 6. A method for correcting a mask comprising the steps of: observing a region including a defect by means of AFM, extracting the defect shape with its near alignment pattern, converting the extracted pattern to a graphic format for an ion beam defect repairing apparatus, forwarding the converted pattern to the ion beam defect repairing apparatus, observing a secondary charged particle image of the region including the defect, combining the alignment pattern with the secondary charged particle image, and repairing the defect using the ion beam. 